![Nano Indenter G200](http://www.space.si/wp-content/uploads/2012/03/nanoindenterSlika2-300x118.png)
Nano Indenter
Basic hardness and Young‘s modulus characterization at specific depth from few nm onwards; Measuring Young‘s modulus and hardness in compliance with ISO 14577; Dynamic characterization through continuous determination of stiffness as a function of depth;…